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    • SEMI
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    SEMI E54.11:2016(R2021)

    Specification for Sensor/Actuator Network Specific Device Model for Endpoint Devices

    Semiconductor Equipment & Materials Institute

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    SEMI F47:2006(R2012)E

    Specification for Semiconductor Processing Equipment Voltage Sag Immunity

    Semiconductor Equipment & Materials Institute

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    SEMI D24 : 2000(R2006)

    SPECIFICATION FOR GLASS SUBSTRATES USED TO MANUFACTURE FLAT PANEL DISPLAYS

    Semiconductor Equipment & Materials Institute

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    SEMI G44 : 1994

    SPECIFICATION FOR LEAD FINISHES FOR GLASS TO METAL SEAL CERAMIC PACKAGES (ACTIVE DEVICES ONLY)

    Semiconductor Equipment & Materials Institute

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    SEMI M51 : 2012

    TEST METHOD FOR CHARACTERIZING SILICON WAFER BY GATE OXIDE INTEGRITY

    Semiconductor Equipment & Materials Institute

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    SEMI C7.15 : 1991

    GUIDELINE FOR 1,1,1-TRICHLOROETHANE, FURNACE GRADE, TIER A

    Semiconductor Equipment & Materials Institute

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    SEMI F109 : 2012

    GUIDE FOR HEATER SYSTEMS REQUIREMENTS

    Semiconductor Equipment & Materials Institute

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    SEMI D22 : 2009

    TEST METHOD FOR THE DETERMINATION OF COLOR, TRANSMITTANCE OF FPD COLOR FILTER ASSEMBLIES

    Semiconductor Equipment & Materials Institute

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    SEMI F21 : 2016

    CLASSIFICATION OF AIRBORNE MOLECULAR CONTAMINANT LEVELS IN CLEAN ENVIRONMENTS

    Semiconductor Equipment & Materials Institute

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    SEMI C77 : 2012

    TEST METHOD FOR DETERMINING THE COUNTING EFFICIENCY OF LIQUID-BORNE PARTICLE COUNTERS FOR WHICH THE MINIMUM DETECTABLE PARTICLE SIZE IS BETWEEN 30 NM AND 100 NM

    Semiconductor Equipment & Materials Institute

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