09/30189791 DC : 0
Current
The latest, up-to-date edition.
Hardcopy , PDF
English
1 Scope
2 Normative references
3 General description
3.1 Morphological definitions of
defect features
3.2 Measurement conditions
3.3 Pre-conditioning
3.4 Recovery
4 Apparatus
4.1 Method A: direct view optical microscopy
4.2 Method B: video microscopy
4.3 Method C: automated analysis microscopy
4.4 Calibration requirements for low and
high resolution systems
5 Procedure
5.1 Measurement regions
5.2 Calibration procedure
5.3 Inspection procedure
5.4 Visual Requirements
Annex A (informative) - Examples of inspected end-faces
with defects
Annex B (normative) - Diagram of calibration artefact
and method of manufacture
B.1 High resolution artefact
B.2 Low resolution artefact
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