14/30299002 DC : 0

Superseded

View Superseded by

BS EN 60749-44 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES

Available format(s)

Hardcopy , PDF

Superseded date

30-11-2016

Language(s)

English

Publisher

British Standards Institution

1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Evaluation
7 Summary
Annex A (informative) - Additional requirements
for the applicable procurement specification
Annex B (informative)
Annex C (informative) - Failure Rate Calculation

BS EN 60749-44.

Committee	EPL/47
DocumentType	Draft
Pages	19
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN 60749-44:2016

IEC 60749-38:2008	Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
IEC 62396-4:2013	Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects
IEC TS 62396-5:2008	Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems