15/30325282 DC : 0

Superseded

BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT

Available format(s)

Hardcopy , PDF

Superseded date

31-10-2017

Language(s)

English

Publisher

British Standards Institution

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test and measurement procedures
Bibliography

BS EN 62884-1.

Committee	EPL/49
DocumentType	Draft
Pages	62
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN 62884-1:2017

IEC 60068-1:2013	Environmental testing - Part 1: General and guidance
IEC 60068-2-58:2015+AMD1:2017 CSV	Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
IEC 60068-2-27:2008	Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008	Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 61837-1:2012	Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
IEC 60679-4:1997	Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
IEC 60068-2-21:2006	Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60068-2-13:1983	Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
IEC 61837-2:2011+AMD1:2014 CSV	Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures
IEC 60679-5:1998	Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
IEC 61837-4:2015	Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
IEC 60749-27:2006+AMD1:2012 CSV	Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
IEC 61019-1:2004	Surface acoustic wave (SAW) resonators - Part 1: Generic specification
IEC 60068-2-31:2008	Environmental testing - Part 2-31: Tests - Test Ec: Rough handling shocks, primarily for equipment-type specimens
IEC 60068-2-64:2008	Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance
IEC 60469-1:1987	Pulse techniques and apparatus. Part 1: Pulse terms and definitions
IEC 60410:1973	Sampling plans and procedures for inspection by attributes
IEC GUIDE 102:1996	Electronic components - Specification structures for qualityassessment (Qualification approval and capability approval)
IEC 61019-2:2005	Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60749-26:2013	Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60068-2-17:1994	Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-10:2005	Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
IEC 60068-2-2:2007	Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 60050-561:2014	International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
IEC 60122-1:2002	Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 60748-2:1997	Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
IEC 60068-2-1:2007	Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60679-3:2012	Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 60679-2:1981	Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
IEC 60068-2-14:2009	Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60679-1:2017	Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
IEC 60068-2-52:2017	Environmental testing - Part 2-52: Tests - Test Kb: Salt mist, cyclic (sodium chloride solution)
IEC 60068-2-30:2005	Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)