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17/30355768 DC : 0

NA
NA

Status of Standard is Unknown

BS IEC 62047-32 ED.1.0 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 32: TEST METHOD FOR THE NONLIEAR VIBRATION OF THE MEMS RESONATORS
Available format(s)

Hardcopy , PDF

Language(s)

English

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test parameters of nonlinear vibration
  of the resonators
5 Test method for the amplitude-frequency
  response and phase-frequency response
  of the nonlinear vibration
6 Test method for the bending factor of the nonlinear
  vibrating frequency response
7 Test method for the amplitude threshold for the nonlinear jump
8 Test method for the frequency deviation as a result of the
  nonlinear vibration
Annex A (normative) - The model of nonlinear vibration
        of the MEMS resonator and the bending factor
Annex B (informative) - Nonlinear jump of the frequency
        response of the MEMS resonator
Annex C (informative) - Frequency deviation of the
        MEMS resonator in the closed-loop system

BS IEC 62047-32 Ed.1.0.

Committee
EPL/47
DocumentType
Draft
Pages
15
PublisherName
British Standards Institution
Status
NA

IEC 62047-1:2016 Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions

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