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17/30363044 DC : 0

NA
NA

Status of Standard is Unknown

BS EN 62047-36 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 36: ENVIRONMENTAL AND DIELECTRIC WITHSTAND TEST METHODS FOR MEMS PIEZOELECTRIC THIN FILMS
Available format(s)

Hardcopy , PDF

Language(s)

English

FOREWORD
INTRODUCTION
1. Scope
2. Normative references
3. Terms and definitions
4. Testing procedure
5. Environmental and dielectric withstand testing
Annex A (informative) - Reports of test results
        (under consideration)

BS EN 62047-36.

Committee
EPL/47
DocumentType
Draft
Pages
17
PublisherName
British Standards Institution
Status
NA

IEC 60384-1:2016 Fixed capacitors for use in electronic equipment - Part 1: Generic specification
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 62047-30:2017 Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film

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$39.22
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