Name: ASTM E 1078 : 2014
Brand: ASTM
Price: 122.77 AUD

ASTM E 1078 : 2014

Superseded

View Superseded by

Standard Guide for Specimen Preparation and Mounting in Surface Analysis

Available format(s)

Hardcopy , PDF

Superseded date

04-12-2020

Language(s)

English

Published date

05-11-2014

Publisher

American Society for Testing and Materials

1.1This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines:

1.1.1Auger electron spectroscopy (AES),

1.1.2X-ray photoelectron spectroscopy (XPS and ESCA), and

1.1.3Secondary ion mass spectrometry (SIMS).

1.1.4Although primarily written for AES, XPS, and SIMS, these methods will also apply to many surface sensitive analysis methods, such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements.

1.2The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Committee	E 42
DocumentType	Guide
Pages	10
PublisherName	American Society for Testing and Materials
Status	Superseded
SupersededBy	ASTM E 1078 : 2014 : R2020
Supersedes	ASTM E 1078 : 2009

ASTM F 2150 : 2013	Standard Guide for Characterization and Testing of Biomaterial Scaffolds Used in Tissue-Engineered Medical Products
ASTM E 2735 : 2014	Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
ASTM E 996 : 2019	Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E 1829 : 2014	Standard Guide for Handling Specimens Prior to Surface Analysis
ASTM E 1523 : 2015	Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E 2108 : 2016	Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM F 2883 : 2011	Standard Guide for Characterization of Ceramic and Mineral Based Scaffolds used for Tissue-Engineered Medical Products (TEMPs) and as Device for Surgical Implant Applications (Withdrawn 2020)
ASTM E 1127 : 2008 : R2015	Standard Guide for Depth Profiling in Auger Electron Spectroscopy
ASTM F 2847 : 2017	Standard Practice for Reporting and Assessment of Residues on Single-Use Implants and Single-Use Sterile Instruments

ASTM E 1829 : 2014	Standard Guide for Handling Specimens Prior to Surface Analysis
ASTM E 1127 : 1991 : R1997	Standard Guide for Depth Profiling in Auger Electron Spectroscopy
ASTM E 1523 : 2009	Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E 1523 : 2003	Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E 1127 : 2008	Standard Guide for Depth Profiling in Auger Electron Spectroscopy
ASTM E 1523 : 2015	Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E 1829 : 2002	Standard Guide for Handling Specimens Prior to Surface Analysis
ASTM E 1829 : 2009	Standard Guide for Handling Specimens Prior to Surface Analysis
ASTM E 1523 : 1997	Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E 1127 : 2008 : R2015	Standard Guide for Depth Profiling in Auger Electron Spectroscopy
ASTM E 1127 : 2003	Standard Guide for Depth Profiling in Auger Electron Spectroscopy
ASTM E 1829 : 1997	Standard Guide for Handling Specimens Prior to Surface Analysis