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ASTM E 1249 : 2015 : R2021

Current
Current

The latest, up-to-date edition.

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

10-02-2021

1.1This practice covers recommended procedures for the use of dosimeters, such as thermoluminescent dosimeters (TLD's), to determine the absorbed dose in a region of interest within an electronic device irradiated using a Co-60 source. Co-60 sources are commonly used for the absorbed dose testing of silicon electronic devices.

Note 1:This absorbed-dose testing is sometimes called “total dose testing” to distinguish it from “dose rate testing.”

Note 2:The effects of ionizing radiation on some types of electronic devices may depend on both the absorbed dose and the absorbed dose rate; that is, the effects may be different if the device is irradiated to the same absorbed-dose level at different absorbed-dose rates. Absorbed-dose rate effects are not covered in this practice but should be considered in radiation hardness testing.

1.2The principal potential error for the measurement of absorbed dose in electronic devices arises from non-equilibrium energy deposition effects in the vicinity of material interfaces.

1.3Information is given about absorbed-dose enhancement effects in the vicinity of material interfaces. The sensitivity of such effects to low energy components in the Co-60 photon energy spectrum is emphasized.

1.4A brief description is given of typical Co-60 sources with special emphasis on the presence of low energy components in the photon energy spectrum output from such sources.

1.5Procedures are given for minimizing the low energy components of the photon energy spectrum from Co-60 sources, using filtration. The use of a filter box to achieve such filtration is recommended.

1.6Information is given on absorbed-dose enhancement effects that are dependent on the device orientation with respect to the Co-60 source.

1.7The use of spectrum filtration and appropriate device orientation provides a radiation environment whereby the absorbed dose in the sensitive region of an electronic device can be calculated within defined error limits without detailed knowledge of either the device structure or of the photon energy spectrum of the source, and hence, without knowing the details of the absorbed-dose enhancement effects.

1.8The recommendations of this practice are primarily applicable to piece-part testing of electronic devices. Electronic circuit board and electronic system testing may introduce problems that are not adequately treated by the methods recommended here.

1.9This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.10This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Committee
E 10
DocumentType
Standard Practice
Pages
17
PublisherName
American Society for Testing and Materials
Status
Current
Supersedes

ASTM E 1250 : 2015 : R2020 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
ASTM F 1892 : 2012 : R2018 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
ASTM F 1190 : 2018 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
ASTM E 1894 : 2018 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
ASTM E 1854 : 2019 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
ASTM F 996 : 2011 : R2018 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics (Withdrawn 2023)
ASTM F 1467 : 2018 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM E 666 : 2014 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation

ASTM E 170 : 2020 Standard Terminology Relating to Radiation Measurements and Dosimetry
ASTM E 666 : 2021 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
ASTM E 170 : 2023 Standard Terminology Relating to Radiation Measurements and Dosimetry
ASTM E 666 : 2014 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation

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