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ASTM E 1438 : 2011

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
Available format(s)

Hardcopy , PDF

Superseded date

15-11-2019

Language(s)

English

Published date

01-11-2011

1.1 This guide provides the SIMS analyst with a method for determining the width of interfaces from SIMS sputtering data obtained from analyses of layered specimens. This guide does not apply to data obtained from analyses of specimens with thin markers or specimens without interfaces such as ion-implanted specimens.

1.2 This guide does not describe methods for the optimization of interface width or the optimization of depth resolution.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Committee
E 42
DocumentType
Guide
Pages
3
PublisherName
American Society for Testing and Materials
Status
Superseded
SupersededBy
Supersedes

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$108.03
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