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ASTM E 2382 : 2004 : R2012

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
Available format(s)

Hardcopy , PDF

Superseded date

04-12-2020

Language(s)

English

Published date

19-12-2012

Publisher

American Society for Testing and Materials

CONTAINED IN VOL. 03.06, 2016 Defines a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and surface interaction, provide literature references of examples and, where possible, to offer an interpretation as to the source of the artifact.

1.1All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and surface interaction, provide literature references of examples and, where possible, to offer an interpretation as to the source of the artifact. Because the scanned probe microscopy field is a burgeoning one, this document is not meant to be comprehensive but rather to serve as a guide to practicing microscopists as to possible pitfalls one may expect. The ability to recognize artifacts should assist in reliable evaluation of instrument operation and in reporting of data.

1.2A limited set of terms will be defined here. A full description of terminology relating to the description, operation, and calibration of STM and AFM instruments is beyond the scope of this document.

1.3The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

Committee
E 42
DocumentType
Guide
Pages
18
ProductNote
Reconfirmed 2012
PublisherName
American Society for Testing and Materials
Status
Superseded
SupersededBy
Supersedes

ASTM E 2859 : 2011 : R2017 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy

ASTM E 1813 : 1996 : R2007 Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy (Withdrawn 2016)
ASTM E 1813 : 1996 : EDT 1 Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
ASTM E 1813 : 1996 : R2002 Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy

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