ASTM E 1249 : 2010
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Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
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ASTM E 2450 : 2005
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Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
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ASTM F 1892 : 1998
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Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
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ASTM E 1855 : 2005
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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
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ASTM F 980 : 1992
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Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
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ASTM E 1854 : 1996
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Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
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ASTM E 1855 : 2004
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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
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ASTM E 1855 : 2004 : EDT 1
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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
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ASTM E 1854 : 2005
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Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
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ASTM E 1249 : 2015 : R2021
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Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
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ASTM E 1855 : 2005 : EDT 1
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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
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ASTM E 264 : 2019
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Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel
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ASTM E 1855 : 2015
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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
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ASTM F 980 : 2016
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Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
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ASTM E 720 : 2002
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Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
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ASTM E 2450 : 2011
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Standard Practice for Application of CaF<sub>2</sub>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
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ASTM E 1249 : 2000 : R2005
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Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
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ASTM E 1854 : 2003
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Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
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ASTM E 264 : 1992 : R1996
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Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel
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ASTM E 721 : 2016
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Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
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ASTM F 1892 : 2004
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Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
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ASTM E 1249 : 2015
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Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
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ASTM E 1855 : 2020
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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
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ASTM E 721 : 2022
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Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
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ASTM F 1892 : 2012
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Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
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ASTM E 1854 : 2013
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Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
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ASTM E 1250 : 2010
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Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
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ASTM E 1855 : 2010
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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
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ASTM E 2450 : 2023
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Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
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ASTM E 264 : 1992
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Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel
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ASTM E 1250 : 1988 : R2000
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Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
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ASTM E 1250 : 1988 : R2005
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Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
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ASTM E 1854 : 2019
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Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
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ASTM E 2450 : 2016
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Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
|
ASTM E 720 : 2016
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Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
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ASTM E 1854 : 2007
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Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
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ASTM F 980 : 2016 : R2024
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Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
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ASTM E 1855 : 1996
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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
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ASTM E 1249 : 2000
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Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
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ASTM E 720 : 1994
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Standard Guide for Selection and Use of Neutron-Activation Foils for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
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ASTM F 1892 : 2012 : R2018
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Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
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ASTM E 720 : 2023
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Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
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ASTM E 1250 : 2015
|
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
|
ASTM E 2450 : 2006
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Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
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ASTM F 1892 : 2006
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Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
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