ASTM F 1262M : 2014 : REDLINE
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Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
English
01-06-2014
CONTAINED IN VOL. 10.04, 2015 Defines experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10[3] Gy (matl.)/s.
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