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ASTM F 1723 : 1996
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Standard Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy
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ASTM F 76 : 2008 : R2016
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Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
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ASTM F 40 : 1983
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Method for Preparing Monocrystalline Test Ingots of Silicon by the Vertical-Pulling (Czochralski) Technique (Withdrawn 1988)
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MIL-STD-989 Base Document:1991
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CERTIFICATION REQUIREMENTS FOR JAN SEMICONDUCTOR DEVICES
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ASTM F 144 : 1980 : R2000
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Standard Practice for Making Reference Glass-Metal Sandwich Seal and Testing for Expansion Characteristics by Polarimetric Methods
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ASTM F 140 : 1998 : R2008
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Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
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ASTM F 144 : 1980 : R1995 : EDT 1
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Standard Practice for Making Reference Glass-Metal Sandwich Seal and Testing for Expansion Characteristics by Polarimetric Methods
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ASTM F 144 : 1980 : R2010
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Standard Practice for Making Reference Glass-Metal Sandwich Seal and Testing for Expansion Characteristics by Polarimetric Methods
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ASTM F 140 : 1998 : R2013
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Standard Practice for<brk type="line"/> Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
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ASTM F 144 : 1980 : R2015
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Standard Practice for Making Reference Glass-Metal Sandwich Seal and Testing for Expansion Characteristics by Polarimetric Methods
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ASTM F 140 : 1998
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Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
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ASTM F 144 : 1980 : R2005
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Standard Practice for Making Reference Glass-Metal Sandwich Seal and Testing for Expansion Characteristics by Polarimetric Methods
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ASTM F 140 : 1998 : R2003
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Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
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ASTM F 850 : 1983 : R1988
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Test Method for Crystallographic Perfection of Gadolinium Gallium Garnet by Preferential Etch Techniques (Withdrawn 1992)
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UNE-EN 50513:2011
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Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing
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ASTM F 1404 : 1992 : R1999
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Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique
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ASTM F 1404 : 1992 : R2007
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Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique (Withdrawn 2016)
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ASTM F 140 : 1998 : R2020
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Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
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ASTM F 144 : 1980 : R2019
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Standard Practice for Making Reference Glass-Metal Sandwich Seal and Testing for Expansion Characteristics by Polarimetric Methods
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ASTM F 416 : 1994
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Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 1998)
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ASTM F 76 : 2008
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Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
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ASTM F 76 : 2008 : R2016 : EDT 1
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Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors (Withdrawn 2023)
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