Name: ASTM F 980M : 1996
Brand: ASTM
Price: 122.77 AUD

ASTM F 980M : 1996

Superseded

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric]

Available format(s)

Hardcopy , PDF

Superseded date

11-11-2014

Language(s)

English

Published date

01-01-1996

Publisher

American Society for Testing and Materials

CONTAINED IN VOL. 10.04, 2009 Establishes procedures and requirements for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from neutron radiation.

1.1 This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from neutron radiation. This test will produce degradation of the electrical properties of the irradiated devices and should be considered a destructive test. Rapid annealing of displacement damage is usually associated with bipolar technologies.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Committee	F 01
DocumentType	Guide
Pages	5
ProductNote	Reconfirmed 1996
PublisherName	American Society for Testing and Materials
Status	Superseded
SupersededBy	ASTM F 980 : 2016 : REDLINE ASTM F 980M : 1996 : R2003
Supersedes	ASTM F 980 : 2010 : EDT 1

ASTM E 720 : 2016 : REDLINE	Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
ASTM E 721 : 2016 : REDLINE	Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
ASTM E 722 : 2014 : REDLINE	Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
ASTM F 1032 : 1991	Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994)
ASTM E 666 : 2014 : REDLINE	Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation