Name: BIS IS/IEC 61558-2-6 : 1ED 2016
Brand: BIS

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES

Published date

09-08-2016

Publisher

Bureau of Indian Standards

FOREWORD 1 Scope 2 Normative references 3 Terms and definitions 4 Test apparatus 5 Procedure neutron irradiated soft error test 6 Evaluation 7 Summary Annex A (informative) - Additional information for the         applicable procurement specification Annex B (informative) - White neutron test apparatus Annex C (informative) - Failure rate calculation Bibliography

Defines a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.

Committee	TC 47
DevelopmentNote	Stability Date: 2020. (07/2016)
DocumentType	Standard
PublisherName	Bureau of Indian Standards
Status	NA
SupersededBy	IS/IEC 61558 : Part 2 : Sec 6 : 2021
Supersedes	BIS IS/IEC 61558-2-6 : 1997

Standards	Relationship
CEI EN 60749-44 : 1ED 2017	Identical
EN 60749-44:2016	Identical
NEN EN IEC 60749-44 : 2016	Identical
NF EN 60749-44 : 2016	Identical
SN EN 60749-44:2016	Identical
BS EN 60749-44:2016	Identical
DIN EN 60749-44:2017-04	Identical
PN EN 60749-44 : 2017	Identical

BS IEC 62396-2:2017	Process management for avionics. Atmospheric radiation effects Guidelines for single event effects testing for avionics systems
17/30352610 DC : 0	BS IEC 62396-2 ED2.0 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS
IEC 62396-2:2017	Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems