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BS CECC 63101:1985

Current
Current

The latest, up-to-date edition.

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

15-01-1985

Provides general conditions, ratings (limiting values), characteristics, test conditions and inspection requirements for a range of film and hybrid integrated circuits.

Committee
EPL/47
DevelopmentNote
Inactive for the new design. (01/2006)
DocumentType
Standard
Pages
16
PublisherName
British Standards Institution
Status
Current

Standards Relationship
CECC 63101 : 84 AMD 1 Identical

BS CECC 63100:1985 Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits
BS 9300:1969 Specification for semiconductor devices of assessed quality: generic data and methods of test
BS 9000-2(1996) : 1996 GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM
BS 6001(1972) : AMD 5054 SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION

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