Semiconductor devices. Mechanical and climatic test methods Low air pressure

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

24-09-2002

Publisher

British Standards Institution

Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only. The contents of the corrigendum of August 2003 have been included in this copy.

Committee	EPL/47
DevelopmentNote	Supersedes 00/203558 DC (10/2002) Supersedes BS EN 60749. (09/2005)
DocumentType	Standard
Pages	10
PublisherName	British Standards Institution
Status	Current
Supersedes	BS EN 60749:1999 00/203558 DC : SEP 2000

Standards	Relationship
DIN EN 60749-2:2003-04	Identical
NF EN 60749-2 : 2002	Identical
UNE-EN 60749-2:2003	Identical
NBN EN 60749-2 : 2003	Identical
I.S. EN 60749-2:2002	Identical
EN 60749-2:2002	Identical
IEC 60749-2:2002	Identical

IEC 60068-2-13:1983	Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
EN 60068-2-13:1999	Environmental testing - Part 2: Tests - Test M: Low air pressure