Integrated circuits. Measurement of impulse immunity Non-synchronous transient injection method

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-10-2013

Publisher

British Standards Institution

1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Coupling networks
6 IC configuration and evaluation
7 Test conditions
8 Test equipment
9 Test set up
10 Test procedure
11 Test report
Annex A (informative) - Test board recommendations
Annex B (informative) - Selection hints for coupling
        and decoupling network values
Annex C (informative) - Industrial and consumer
        applications
Annex D (informative) - Vehicle applications
Annex ZA (normative) - Normative references to
         international publications with their corresponding
         European publications

Defines a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances.

IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.

Committee	EPL/47
DevelopmentNote	Supersedes 10/30209944 DC. (10/2013)
DocumentType	Standard
Pages	36
PublisherName	British Standards Institution
Status	Current
Supersedes	10/30209944 DC : 0

Standards	Relationship
EN 62215-3:2013	Identical
IEC 62215-3:2013	Identical

EN 62132-4:2006	Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
IEC 61000-4-4 : 3.0EN+(REDLINE+VERSION)	ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-4: TESTING AND MEASUREMENT TECHNIQUES - ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST
IEC 62132-4:2006	Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
ISO 7637-2:2011	Road vehicles Electrical disturbances from conduction and coupling Part 2: Electrical transient conduction along supply lines only
IEC 61000-4-4:2012 RLV	Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
EN 61000-4-4:2012	ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-4: TESTING AND MEASUREMENT TECHNIQUES - ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST (IEC 61000-4-4:2012)

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BS EN 62215-3:2013

Current

Table of Contents

Abstract

Scope

General Product Information

International Equivalents

Standards Referencing This Book

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