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BS EN 62276:2016

Current
Current

The latest, up-to-date edition.

Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-12-2016

IEC 62276:2016 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition:
- Corrections of Euler angle indications in Table 1 and axis directions in Figure 3.
- Definition of \'twin\' is not explained clearly enough in 3.3.3. Therefore it is revised by a more detailed definition.
- Etch channels maximum number at quartz wafer of seed which do not pass through from surface to back surface are classified for three grades in 4.2.13 a). Users use seed portions of quartz wafers for devices. They request quartz wafers with less etch channels in seeds to reduce defects of devices. The classification of etch channels in seed may prompt a rise in quartz wafer quality.

Committee
W/-
DevelopmentNote
Supersedes BS PD IEC/PAS 62276. (02/2006) Supersedes 03/108069 DC. (03/2006) Supersedes 09/30207175 DC. (02/2013) Supersedes 15/30318551 DC. (12/2016)
DocumentType
Standard
Pages
46
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
SN EN 62276 : 2016 Identical
IEC 62276:2016 Identical
NBN EN 62276 : 2013 Identical
I.S. EN 62276:2016 Identical
DIN EN 62276:2015-04 (Draft) Identical
EN 62276:2016 Identical
NF EN 62276 : 2013 Identical

EN ISO 4287:1998/A1:2009 GEOMETRICAL PRODUCT SPECIFICATIONS (GPS) - SURFACE TEXTURE: PROFILE METHOD - TERMS, DEFINITIONS AND SURFACE TEXTURE PARAMETERS
ISO 4287:1997 Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters
EN 61019-1 : 2005 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
IEC 61019-1:2004 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
EN 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
IEC 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
IEC 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
EN 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
IEC 61019-3:1991 Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

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