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BS IEC 60747-14.2 : 2000

Current
Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - PART 14-2: SEMICONDUCTOR SENSORS - HALL ELEMENTS
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2000

FOREWORD
INTRODUCTION
Clause
1 General
   1.1 Scope
   1.2 Normative references
   1.3 Definitions
   1.4 Symbols
2 Essential ratings and characteristics
   2.1 General
   2.2 Ratings (limiting values)
   2.3 Characteristics
3 Measuring methods
   3.1 General
   3.2 Output Hall voltage (VH)
   3.3 Offset voltage (Vo)
   3.4 Input resistance (Rin)
   3.5 Output resistance (Rout)
   3.6 Temperature coefficient of output Hall
       voltage (alpha VH)
   3.7 Temperature coefficient of input resistance
       (alpha Rin)

   3.5

Gives standards for packaged semiconductor Hall elements which utilize the Hall effect.

Committee
EPL/47
DevelopmentNote
Supersedes 93/200028 DC. (06/2005)
DocumentType
Standard
Pages
18
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
IEC 60747-14-2:2000 Identical

IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General

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