BS IEC 60747-4 : 2007
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 4: MICROWAVE DIODES AND TRANSISTORS
Hardcopy , PDF
11-06-2020
English
01-01-2007
FOREWORD
1 Scope
2 Normative references
3 Variable capacitance, snap-off diodes and fast-switching
schottky diodes
3.1 Variable capacitance diodes
3.1.1 General
3.1.2 Terminology and letter symbols
3.1.3 Essential ratings and characteristics
3.1.4 Measuring methods
3.2 Snap-off diodes, Schottky diodes
3.2.1 General
3.2.2 Terminology and letter symbols
3.2.3 Essential ratings and characteristics
3.2.4 Measuring methods
4 Mixer diodes and detector diodes
4.1 Mixer diodes used in radar applications
4.1.1 General
4.1.2 Terminology and letter symbols
4.1.3 Essential ratings and characteristics
4.1.4 Measuring methods
4.2 Mixer diodes used in communication applications
4.2.1 General
4.2.2 Terminology and letter symbols
4.2.3 Essential ratings and characteristics
4.2.4 Measuring methods
4.3 Detector diodes
5 Impatt diodes
5.1 Impatt diodes amplifiers
5.1.1 General
5.1.2 Terms and definitions
5.1.3 Essential ratings and characteristics
5.2 Impatt diodes oscillators
6 Gunn diodes
6.1 General
6.2 Terms and definitions
6.3 Essential ratings and characteristics
6.4 Measuring methods
6.4.1 Pulse breakdown voltage
6.4.2 Threshold voltage
6.4.3 Resistance
7 Bipolar transistors
7.1 General
7.2 Terms and definitions
7.3 Essential ratings and characteristics
7.3.1 General
7.3.2 Limiting values (absolute maximum rating system)
7.4 Measuring methods
7.4.1 General
7.4.2 DC characteristics
7.4.3 RF characteristics
7.5 Verifying methods
7.5.1 Load mismatch tolerance ([Psi][L])
7.5.2 Source mismatch tolerance ([Psi][S])
7.5.3 Load mismatch ruggedness ([Psi][R])
8 Field-effect transistors
8.1 General
8.2 Terms and definitions
8.3 Essential ratings and characteristics
8.3.1 General
8.3.2 Limiting values (absolute maximum rating
system)
8.4 Measuring methods
8.4.1 General
8.4.2 DC characteristics
8.4.3 RF characteristics
8.5 Verifying methods
8.5.1 Load mismatch tolerance ([Psi][L])
8.5.2 Source mismatch tolerance ([Psi][S])
8.5.3 Load mismatch ruggedness ([Psi][R])
9 Assessment and reliability - specific requirements
9.1 Electrical test conditions
9.2 Failure criteria and failure-defining characteristics
for acceptance tests
9.3 Failure criteria and failure-defining characteristics
for reliability tests
9.4 Procedure in case of a testing error
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