Silk. Electronic test method for defects and evenness of raw silk

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-05-2014

Publisher

British Standards Institution

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Principle
5 Apparatus
6 Atmospheres for conditioning and testing
7 Lot formation and sampling
8 Laboratory sample preparation
9 Setting
10 Test procedure
11 Calculation and expression of test results
12 Precision
13 Test report
Annex A (normative) - Defect counting and classification
Annex B (informative) - Difference between the optical and
        capacitive sensors in detecting defects of raw silk
Annex C (normative) - Method for preparing soaked raw silk
        in lab
Annex D (informative) - An example of the electronic testing
        result sheet
Annex E (informative) - Testing precision
Bibliography

Describes a test method for defects and evenness of raw silk by capacitive and optical electronic testers.

This International Standard specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.

This International Standard is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.

Committee	TCI/100
DevelopmentNote	Supersedes 12/30228371 DC. (05/2014)
DocumentType	Standard
Pages	26
PublisherName	British Standards Institution
Status	Current
Supersedes	12/30228371 DC : 0

Standards	Relationship
ISO 15625:2014	Identical

ISO 2060:1994	Textiles — Yarn from packages — Determination of linear density (mass per unit length) by the skein method
ISO 5725-2:1994	Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method
ISO 3696:1987	Water for analytical laboratory use — Specification and test methods
ISO 139:2005	Textiles Standard atmospheres for conditioning and testing

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BS ISO 15625:2014

Silk. Electronic test method for defects and evenness of raw silk

Table of Contents

Abstract

Scope

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory