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BS ISO 18257:2016

Current

Current

The latest, up-to-date edition.

Space systems. Semiconductor integrated circuits for space applications. Design requirements

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

30-11-2016

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviated terms
5 General requirements
6 Design process
7 Detailed requirements
Annex A (normative) - Datasheet
Annex B (informative) - Guidance
Bibliography

Defines the basic design requirements for semiconductor ICs for space applications, including its design process, as well as required tasks and requirements of each stage.

Committee
ACE/68
DevelopmentNote
Supersedes 15/30303546 DC. (11/2016)
DocumentType
Standard
Pages
36
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
ISO 18257:2016 Identical

IEC 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
IEC 62215-3:2013 Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
ISO 10795:2011 Space systems Programme management and quality Vocabulary
IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture

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$478.43
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