Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-10-2016

Publisher

British Standards Institution

Foreword
Introduction
1 Scope
2 Normative references
3 Abbreviated terms
4 Procedure for quantification
5 Test report
Annex A (informative) - Physical effects and correction
Annex B (informative) - Outline of various correction
techniques
Annex C (informative) - Measurement of the k-ratios in
case of 'chemical effects'
Bibliography

Provides requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through analysis of the X-rays generated by an electron beam using a wavelength dispersive spectrometer (WDS) fitted either to an electron probe microanalyser or to a scanning electron microscope (SEM).

Committee	CII/9
DevelopmentNote	Supersedes 05/30118737 DC (02/2007)
DocumentType	Standard
Pages	26
PublisherName	British Standards Institution
Status	Current
Supersedes	BS ISO 22489:2006 05/30118737 DC : DRAFT SEP 2005

Standards	Relationship
ISO 22489:2016	Identical

ISO/IEC 17025:2005	General requirements for the competence of testing and calibration laboratories
ISO 23833:2013	Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
ISO 14594:2014	Microbeam analysis Electron probe microanalysis Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 14595:2014	Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO 17470:2014	Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 22309:2011	Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above

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BS ISO 22489:2016

Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy

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Abstract

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