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BS ISO 23833:2013

Current
Current

The latest, up-to-date edition.

Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

30-04-2013

Foreword
Introduction
1 Scope
2 Abbreviated terms
3 Definitions of general terms used in electron
  probe microanalysis
4 Definition of terms used to describe EPMA
  instrumentation
5 Definitions of terms used in EPMA methodology
Bibliography

Describes terms used in the practices of electron probe microanalysis (EPMA).

This International Standard defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.

This International Standard is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of this International Standard are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.

Committee
CII/9
DevelopmentNote
Supersedes 03/316090 DC (01/2007)
DocumentType
Standard
Pages
38
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
ISO 23833:2013 Identical

BS PAS 134(2007) : 2007 TERMINOLOGY FOR CARBON NANOSTRUCTURES
BS PAS 134(2012) : 2012 TERMINOLOGY FOR CARBON NANOSTRUCTURES
BS PAS 133(2007) : 2007 TERMINOLOGY FOR COMMON NANOSCALE MEASUREMENT AND INSTRUMENTATION

ISO 1087-1:2000 Terminology work Vocabulary Part 1: Theory and application
ISO 18115-1:2013 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
ISO/IEC Guide 99:2007 International vocabulary of metrology Basic and general concepts and associated terms (VIM)
ISO 18115-2:2013 Surface chemical analysis Vocabulary Part 2: Terms used in scanning-probe microscopy
ISO 704:2009 Terminology work — Principles and methods
ISO 15632:2012 Microbeam analysis Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

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