Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

30-09-2015

Publisher

British Standards Institution

This part of IEC 61967 provides guidance for exchanging data generated by near-field scan measurements.

The described exchange format could also be used for near-field scan data generated by simulation or computation software. It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application. The exchange format can be applied to emission and immunity near-field scan data in the frequency and time domains.

The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein.

Committee	EPL/47
DocumentType	Standard
Pages	68
PublisherName	British Standards Institution
Status	Current
Supersedes	PD IEC/TR 61967-1-1:2010

Standards	Relationship
IEC TR 61967-1-1:2015	Identical

IEC 60050-131:2002	International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory
IEC TS 62132-9:2014	Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
IEC 61967-1:2002	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC TS 61967-3:2014	Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC 62132-1:2015	Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
ISO 8879:1986	Information processing Text and office systems Standard Generalized Markup Language (SGML)
IEEE 754-2008 REDLINE	IEEE Standard for Floating-Point Arithmetic