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BS QC 390000:1992

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Generic specification
Available format(s)

Hardcopy , PDF

Superseded date

29-02-2012

Language(s)

English

Published date

15-07-1992

Committees responsible
National foreword
Specification
Section 1. Scope
1. Scope
Section 2. General
2. General
2.1 Related documents
2.2 Units, symbols and terminology
2.3 Preferred values
2.4 Marking
Section 3. Quality assessment procedures
3. Quality assessment procedures
3.1 Qualification approval/quality assessment systems
3.2 Primary stage of manufacture
3.3 Manufacturing stages in a factory of an approved
      manufacturer in a non-IECQ member country and sub-
      contracting
3.4 Manufacturer approval
3.5 Approval procedures
3.6 Qualification approval procedures
3.7 Capability approval procedures
3.8 Quality conformance inspection
3.9 Alternative test methods
3.10 Unchecked parameters
Section 4. Test and measurement procedures
4. Test and measurement procedures
4.1 General
4.2 Standard atmosphere conditions
4.3 Drying
4.4 Visual examination and check of dimensions
4.5 Resistance
4.6 Resistance ratio
4.7 Functional characteristics
4.8 Insulation resistance (insulated styles only)
4.9 Voltage proof (insulated networks only)
4.10 Variation of resistance with temperature
4.11 Non-linear properties
4.12 Overload
4.13 Robustness of terminations
4.14 Solderability
4.15 Resistance to soldering heat
4.16 Rapid change of temperature
4.17 Shock
4.18 Vibration
4.19 Climatic sequence
4.20 Damp heat, steady state
4.21 Endurance
4.22 Component solvent resistance
4.23 Solvent resistance of the marking
Appendices
A. Interpretation of sampling plans and procedures as
      described in IEC Publication 410 for use within the
      IEC Quality Assessment System for Electronic
      Components
B. Rules for the preparation of detail specification
      for capacitors and resistors for electronic
      equipment

Establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications for qualification approval and capability approval of fixed film resistor networks.

Committee
W/-
DevelopmentNote
Also numbered as IEC 61045-1 (08/2005)
DocumentType
Standard
Pages
48
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

BS QC 390100:1992 Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Sectional specification for film resistor networks of assessed quality on the basis of the capability approval procedure

BS 5692:1979 Method for measurement of the dimensions of a cylindrical electronic component having two axial terminations
BS 2011-2.1M:1984 Environmental testing. Tests Test M. Low air pressure
BS 3934-1:1992 Mechanical standardization of semiconductor devices Recommendations for the preparation of drawings of semiconductor devices
BS 2011-2.1B:1977 Environmental testing. Tests Tests B. Dry Heat
BS 4119:1967 Method of measurement of current noise generated in fixed resistors
BS 6303:1982 Method for determination of the space required by capacitors and resistors with unidirectional terminations
BS 2011-2.1XA(1981) : 1981 AMD 7553 ENVIRONMENTAL TESTING - TESTS - TEST XA AND GUIDANCE - IMMERSION IN CLEANING SOLVENTS
BS 2488:1966 Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment
IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
BS 2011-2.1N:1985 Environmental testing. Tests Test N. Change of temperature
BS 2045:1965 Preferred numbers
BS 2011-2.1Ca:1977 Environmental testing. Tests Test Ca. Damp heat, steady state
BS QC 001002:1991 Rules of procedure of the IEC quality assessment system for electronic components (IECQ)
BS 5555:1981 Specification for SI units and recommendations for the use of their multiples and of certain other units
BS QC 763000(1990) : AMD 6754 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. FILM AND HYBRID FILM INTEGRATED CIRCUITS. GENERIC SPECIFICATION
BS 5694:1979 Method for measurement of non-linearity in resistors
BS 6001(1972) : AMD 5054 SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION
BS 2011-2.1T:1981 Environmental testing. Tests Test T. Soldering

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