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  • BS QC 400000:1990

    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
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    HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT: GENERIC SPECIFICATION

    Available format(s):  Hardcopy, PDF

    Withdrawn date:  01-04-2007

    Language(s):  English

    Published date:  01-01-1990

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    National foreword
    Committees responsible
    Section One - Scope
    1. Scope
    Section Two - General
    2. General
    2.1 Related documents
    2.2 Units, symbols and terminology
    2.3 Preferred values
    2.4 Marking
    Section Three. Quality assessment procedures
    3. Quality assessment procedures
    3.1 Qualification Approval/Quality Assessment Systems
    3.2 Primary Stage of Manufacture
    3.3 Structurally Similar Components
    3.4 Qualification Approval Procedures
    3.5 Quality Conformance Inspection
    3.6 Alternative test methods
    3.7 Unchecked parameters
    Section Four. Test and measurement procedures
    4. Test and measurement procedures
    4.1 General
    4.2 Standard atmospheric conditions
    4.3 Drying
    4.4 Visual examination and check of dimensions
    4.5 Resistance
    4.6 Insulation resistance (insulated styles only)
    4.7 Voltage proof
    4.8 Variation of resistance with temperature
    4.9 Reactance
    4.10 Non-linear properties
    4.11 Voltage coefficient
    4.12 Noise
    4.13 Overload
    4.14 Temperature rise
    4.15 Robustness of the resistor body
    4.16 Robustness of terminations
    4.17 Solderability
    4.18 Resistance to soldering heat
    4.19 Rapid change of temperature
    4.20 Bump
    4.21 Shock
    4.22 Vibration
    4.23 Climatic sequence
    4.24 Damp heat, steady state
    4.25 Endurance
    4.26 Accidental overload test (for low power non-
          wirewound resistors only)
    4.27 Single-pulse high-voltage overload test
    4.28 Periodic pulse high-voltage overload test
    4.29 Component solvent resistance
    4.30 Solvent resistance of marking
    4.31 Mounting (for chip resistors only)
    4.32 Adhesion
    4.33 Bond strength of the end face plating
    Appendix
    A. Interpretation of sampling plans and procedures as
          described in IEC Publication 410 for use within
          the IEC Quality Assessment System for Electronic
          Components
    B. Rules for the preparation of detail specifications
          for capacitors and resistors for electronic
          equipment
    C. Example of a test equipment for the periodic pulse
          high-voltage overload test

    Abstract - (Show below) - (Hide below)

    Describes fixed resistors for use in electronic equipment. Establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications for qualification approval and for quality assessment systems for electronic components.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/40
    Development Note Supersedes 85/24369 DC and BS 9940-0(1983). (08/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Withdrawn
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS QC 400202:1992 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - BLANK DETAIL SPECIFICATION - FIXED POWER RESISTORS - ASSESSMENT LEVEL F
    BS QC 400102:1992 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - BLANK DETAIL SPECIFICATION - FIXED LOW-POWER NON-WIREWOUND RESISTORS - ASSESSMENT LEVEL F
    BS QC 400600:1990 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - SECTIONAL SPECIFICATION: FIXED SURFACE MOUNTING (CHIP) RESISTORS
    BS QC 400203:1993 SPECIFICATION FOR FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - BLANK DETAIL SPECIFICATION - FIXED POWER RESISTORS, HEAT-SINK TYPES - ASSESSMENT LEVEL H
    BS QC 400302:1992 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - BLANK DETAIL SPECIFICATION - FIXED PRECISION RESISTORS - ASSESSMENT LEVEL F

    Standards Referencing This Book - (Show below) - (Hide below)

    BS 5692:1979 METHOD FOR MEASUREMENT OF THE DIMENSIONS OF A CYLINDRICAL ELECTRONIC COMPONENT HAVING TWO AXIAL TERMINATIONS
    BS 2011-2.1B(1977) : 1977 ENVIRONMENTAL TESTING - TESTS - TEST B. DRY HEAT
    BS 4119:1967 METHOD OF MEASUREMENT OF CURRENT NOISE GENERATED IN FIXED RESISTORS
    BS 923-2(1980) : 1980 GUIDE ON HIGH-VOLTAGE TESTING TECHNIQUES - TEST PROCEDURES
    BS 2488:1966 SCHEDULE OF PREFERRED NUMBERS FOR THE RESISTANCE OF RESISTORS AND THE CAPACITANCE OF CAPACITORS FOR TELECOMMUNICATION EQUIPMENT
    IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
    BS 2011-2.1N:1985 ENVIRONMENTAL TESTING - TESTS - TEST N: CHANGE OF TEMPERATURE
    BS 2045:1965 PREFERRED NUMBERS
    BS 2011-2.1Ca:1977 ENVIRONMENTAL TESTING - TESTS - TEST CA - DAMP HEAT, STEADY STATE
    BS 4727(1971) : LATEST
    BS 9000-3:1987 GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR NATIONAL IMPLEMENTATION OF IECQ BASIC RULES AND RULES OF PROCEDURE
    BS 5694:1979 METHOD FOR MEASUREMENT OF NON-LINEARITY IN RESISTORS
    BS 6001(1972) : AMD 5054 SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION
    BS 2011-2.1T:1981 ENVIRONMENTAL TESTING - TESTS - TEST T - SOLDERING
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