Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

30-04-1990

Publisher

British Standards Institution

National foreword
Committees responsible
Clause
SECTION 1 - SCOPE, OBJECT AND CLASSIFICATION
1.1 Scope
1.2 Object
1.3 Technological classification of F and HFICs
SECTION 2 - GENERAL
2.1 Order of precedence
2.2 Related documents
2.3 Units and symbols
2.4 Terminology
2.5 Standard and preferred values
2.6 Marking
SECTION 3 - QUALITY ASSESSMENT PROCEDURES
3.1 Primary stage of manufacture
3.2 Manufacturing stages and sub-contracting
3.3 Manufacturer approval
3.4 Approval of film integrated circuits and hybrid
film integrated circuits
3.5 Qualification approval
3.6 Capability approval
3.7 Certified records of released lots
3.8 Delayed deliveries
3.9 Delivery of F and HFICs subjected to destructive
or non-destructive tests
3.10 Supplementary procedure for deliveries
3.11 Supplementary information
SECTION 4 - TEST AND MEASUREMENT PROCEDURES
4.1 General
4.2 Standard conditions for testing
4.3 Visual examination
4.4 Electrical measurement procedures
4.5 Environmental testing procedures

Provides the quality assessment procedures and methods for electrical, climatic, mechanical and endurance tests, together with an outline of the requirements applicable to the release of film and hybrid film integrated circuits using either qualification or capability approval procedures.

Committee	EPL/47
DevelopmentNote	Also numbered as IEC 60748-20 Supersedes 85/22458 DC and 95/205099 DC (08/2005)
DocumentType	Standard
Pages	34
PublisherName	British Standards Institution
Status	Current
Supersedes	95/205099 DC : MAY 95

BS QC 760101:1997	Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
BS QC 760200:1997	Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
BS QC 760201:1997	Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures

BS 2011-2.1B:1977	Environmental testing. Tests Tests B. Dry Heat
BS 6458-2.2(1984) : 1984	FIRE HAZARD TESTING FOR ELECTROTECHNICAL PRODUCTS - METHODS OF TEST - NEEDLE FLAME TEST
BS 6493-1.1:1984	Semiconductor devices. Discrete devices General
BS 6001-1:1991	Sampling procedures for inspection by attributes Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection
BS 6493-2.1:1985	Semiconductor devices. Integrated circuits General
BS 2011-2.1XA(1981) : 1981 AMD 7553	ENVIRONMENTAL TESTING - TESTS - TEST XA AND GUIDANCE - IMMERSION IN CLEANING SOLVENTS
BS 2011-2.1N:1985	Environmental testing. Tests Test N. Change of temperature
BS 2011-2.1Ca:1977	Environmental testing. Tests Test Ca. Damp heat, steady state
BS 6493-3:1985	Semiconductor devices Mechanical and climatic test methods
BS 5555:1981	Specification for SI units and recommendations for the use of their multiples and of certain other units
BS 2011-2.1Ka:1982	Environmental testing. Tests Test Ka.Salt mist
BS 3934:1965	Specification for dimensions of semiconductor devices and integrated electronic circuits
BS 2011-3A & B:1977	Environmental testing. Background information Tests A (cold) and tests B (dry heat)
BS 2011-2.1T:1981	Environmental testing. Tests Test T. Soldering

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BS QC 760000:1990

Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification

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Abstract

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