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BS QC790100(1991) : 1991 AMD 10586

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
Superseded date

31-05-2000

Published date

23-11-2012

Committees responsible
National foreword
1. Scope
2. General
2.1 Related documents
2.2 Recommended values of temperatures
2.3 Recommended values of voltages
2.4 Definitions related to manufacturing operations
3. Subcontracting
4. Primary stage of manufacture
4.1 Bipolar devices
4.2 Unipolar devices
5. Quality assessment procedures
5.1 Qualification approval procedures
5.2 Capability approval procedures
6. Structural similarity procedures
6.1 General rules
6.2 Test dependent criteria for structural similarity -
      Table 1
7. Groups and sub-groups
      Table II - Group A: Lot-by-lot
      Table III - Group B: Lot-by-lot
      Table IV - Group C: Periodic tests
      Table V - Group D
8. Screening
      Table VI - Screening
9. Sampling requirements
      Table VII - Sampling requirements for Group A tests
      Table VIII - Sampling requirements for Group B, C
      and D tests in which LTPD shall be used
10. Terminal identification
11. Additional information (under consideration)
12. Test and measurement procedures
12.1 Electrical measuring methods
12.2 Mechanical and climatic test methods
12.3 Electrical endurance tests
12.4 Accelerated test procedures
12.5 Correlated measurements
Appendix
A. Guidance and format for drafting blank detail
      specifications

Describes encapsulated semiconductor integrated circuits, including multi-chip integrated circuits, but excluding hybrid circuits. BS AMD 10586 RENUMBERS THIS STANDARD.

Committee
ECL/24
DevelopmentNote
Renumbered and superseded by BS IEC 60748-11. (07/2011)
DocumentType
Standard
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

Standards Relationship
IEC 60748-11:1990 Identical

BS QC 790131:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Complementary MOS digital integrated circuits (series 4000 B and 4000 UB)
BS QC 790132:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
BS QC 790130:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)
BS IEC 60747-10:1991 Semiconductor devices Generic specification for discrete devices and integrated circuits
BS QC 790303:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC)
BS QC 790110:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits
BS QC 790111:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories
BS QC 790202:1991 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers
BS QC700000(1991) : 1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS
BS QC 790304:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC)
BS QC 790104:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB
BS QC 790105:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories

IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
IEC 60191-2:2012 DB Mechanical standardization of semiconductor devices - Part 2: Dimensions
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60617-13:1993 Graphical symbols for diagrams - Part 13: Analogue elements
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General
IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
IEC 60191-4:2013 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
IEC 60748-3:1986 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
IEC 60617-12:1997 Graphical symbols for diagrams - Part 12: Binary logic elements

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