Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Family specification for HCMOS digital integrated circuits series 54/74 HC, 54/74 HCT, 54/74 HCU

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

15-05-1992

Publisher

British Standards Institution

NO CONTENTS SECTION

Acts as a blank detail specification for semiconductor devices.

Committee	EPL/47
DocumentType	Standard
Pages	26
PublisherName	British Standards Institution
Status	Current

IEC 60747-10:1991	Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
IEC 60748-11:1990	Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
IEC 60068-2-17:1994	Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60748-2-3:1992	Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section three: Blank detail specification for HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV	Semiconductor devices - Mechanical and climatic test methods
IEC 60748-2:1997	Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits