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CECC 50000 : 86 AMD 3

Withdrawn
Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION FOR DISCRETE SEMICONDUCTOR DEVICES
Withdrawn date

02-06-2016

Published date

12-01-2013

Committee
SR 47E
DevelopmentNote
Also numbered as I.S. 543 (01/2002)
DocumentType
Standard
PublisherName
Cenelec Electronic Components Committee
Status
Withdrawn

BS E9376(1976) : 1976 AMD 7597 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION. VARIABLE CAPACITANCE DIODE(S)
BS CECC 50010(1983) : 1983 AMD 7591 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPEC - AMBIENT RATED THYRISTORS
DEFSTAN 59-61(PT4)/1(1981) : 1981 SEMICONDUCTOR DEVICES - PART 4: TRANSISTORS, NPN TYPE
DEFSTAN 59-61(PT7)/1(1981) : 1981 SEMICONDUCTOR DEVICES - PART 7: OPTOELECTRONIC DEVICES
BS EN 150009:1993 Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes
BS CECC 50013(1984) : 1984 AMD 7594 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS BLANK DETAIL SPEC - CURRENT REGULATOR & CURRENT REFERENCE DIODES
BS EN 150008:1993 Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes
BS EN 150012:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors
BS CECC 50012(1978) : 1978 AMD 7593 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPEC - SINGLE GATE FIELD EFFECT TRANSISTORS
BS CECC50008(1992) : 1992 AMD 7698 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: BLANK DETAIL SPECIFICATION: AMBIENT RATED RECTIFIER DIODES
BS CECC50009(1992) : 1992 AMD 7699 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: CASE RATED RECTIFIER DIODES
BS CECC17000(1992) : 1992 AMD 9626 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - SOLID STATE ALL OR NOTHING RELAYS - GENERIC DATA AND METHODS OF TEST
BS CECC50001(1981) : 1981 AMD 7590 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: GENERAL PURPOSE SEMICONDUCTOR DIODES
BS E9374(1976) : 1976 AMD 7596 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: BIPOLAR TRANSISTORS FOR SWITCHING APPLICATIONS
DEFSTAN 59-61(PT5)/1(1981) : 1981 SEMICONDUCTOR DEVICES - PART 5: TRANSISTORS, PNP TYPE
DEFSTAN 59-61(PT1)/3(1981) : 1981 SEMICONDUCTOR DEVICES - PART 1: GENERAL REQUIREMENTS
DIN EN 150010:1997-02 BLANK DETAIL SPECIFICATION - AMBIENT-RATED THYRISTORS
BS EN 150015:1993 Harmonized system of quality assessment for electronic components. Blank detail specification: unidirectional transient overvoltage suppressor diodes
BS CECC 50011(1983) : 1983 AMD 7592 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPEC - CASE RATED THYRISTORS
04/30114936 DC : DRAFT JUN 2004 EN 50439 - RAILWAY APPLICATIONS - RELIABILITY TESTS FOR HIGH POWER SEMICONDUCTORS DEVICES - PART 1: STANDARD BASE-PLATE MODULES
DEFSTAN 59-61(PT6)/1(1981) : 1981 SEMICONDUCTOR DEVICES - PART 6: FIELD EFFECT TRANSISTORS
BS E9377(1976) : 1976 AMD 7598 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: CASE RATED BIPOLAR TRANSISTORS FOR HIGH FREQUENCY AMPLIFICATION
DIN EN 150008:1993-10 BLANK DETAIL SPECIFICATION: AMBIENT-RATED RECTIFIER DIODES
DEFSTAN 59-61(PT3)/2(1981) : 1981 SEMICONDUCTOR DEVICES - PART 3: THYRISTORS
EN 150012 : 1991 Blank Detail Specification: Single gate field-effect transistors

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