CEI EN 138000 : 1996
Current
The latest, up-to-date edition.
Hardcopy , PDF
English
01-01-1996
1 SCOPE
2 GENERAL
3 QUALITY ASSESSMENT PROCEDURES
4 TEST AND MEASUREMENT PROCEDURES
Annex A - INTERPRETATION OF SAMPLING
PLANS AND PROCEDURES AS DESCRIBED
IN IEC 410 FOR USE WITHIN THE CECC
SYSTEM FOR ELECTRONIC COMPONENTS
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