CEI EN 60749-20 : 2010

Superseded

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 20: RESISTANCE OF PLASTIC ENCAPSULATED SMDS TO THE COMBINED EFFECT OF MOISTURE AND SOLDERING HEAT

Available format(s)

Hardcopy , PDF

Superseded date

25-01-2021

Language(s)

English

Published date

01-01-2010

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
1 Scope
2 Normative references
3 General description
4 Test apparatus and materials
5 Procedure
6 Information to be given
  in the relevant specification
Annex A (informative) - Details
        and descriptions of test
        method on resistance of
        plastic encapsulated SMDs
        to the combined effect of
        moisture and soldering heat

Defines a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs).

Committee	CT 309
DevelopmentNote	Classificazione CEI 47-25 (04/2004) Supersedes CEI EN 60749. (05/2008)
DocumentType	Standard
Pages	34
PublisherName	Comitato Elettrotecnico Italiano
Status	Superseded
SupersededBy	CEI EN IEC 60749-20:2020
Supersedes	CEI EN 60749 : 2000 AMD 2 2004

Standards	Relationship
IEC 60749-20:2008	Identical
EN 60749-20:2009	Identical

IEC 60068-2-20:2008	Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
EN 60068-2-20:2008	Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
EN 60749-35:2006	Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
IEC 60749-35:2006	Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
IEC 60749-3:2017	Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
EN 60749-3:2017	Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

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CEI EN 60749-20 : 2010

Superseded

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory

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