CEI EN 61643-341 : 2002

Superseded

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COMPONENTS FOR LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 341: SPECIFICATION FOR THYRISTOR SURGE SUPPRESSOR (TSS)

Available format(s)

Hardcopy , PDF

Superseded date

24-06-2021

Language(s)

English - Italian

Published date

01-01-2002

Publisher

Comitato Elettrotecnico Italiano

1 SCOPE
2 NORMATIVE REFERENCES
3 TERMS, LETTER SYMBOLS
  AND DEFINITIONS
4 BASIC FUNCTION AND
  COMPONENT DESCRIPTION
5 STANDARD TEST METHODS
Annex A (normative) ABNORMAL
        SERVICE CONDITIONS
Annex B (informative) - US
         VERIFICATION
         STANDARDS WITH
         REFERENCED IMPULSE
         WAVEFORMS
Annex ZA (normative) - Normative
         references to international
         publications with their
         corresponding European
         publications

Describes test specification standard for thyristor surge suppressor (TSS) components designed to limit overvoltages and divert surge currents by clipping and crowbarring actions. Such components are used in the construction of surge protective devices, particularly as they apply to telecommunications.

Committee	CT 37
DevelopmentNote	Classificazione CEI 37-5. (12/2002)
DocumentType	Standard
Pages	88
PublisherName	Comitato Elettrotecnico Italiano
Status	Superseded
SupersededBy	CEI EN IEC 61643-341:2021

Standards	Relationship
IEC 61643-341:2001	Identical
EN 61643-341:2001	Identical

IEC 60050-702:1992	International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices
IEC 60721-3-9:1993	Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities - Section 9: Microclimates inside products
IEC 60099-4:2014	Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
EN 60721-3-9:1993/A1:1995	CLASSIFICATION OF ENVIRONMENTAL CONDITIONS - PART 3: CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES - SECTION 9: MICROCLIMATES INSIDE PRODUCTS
EN 60749 : 99 AMD 2 2001	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
EN 60099-4:2014	Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
EN 61083-1:2001	Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV	Semiconductor devices - Mechanical and climatic test methods
IEC 60721-3-3:1994+AMD1:1995+AMD2:1996 CSV	Classification of environmental conditions - Part 3-3: Classification of groups of environmental parameters and their severities - Stationary use at weatherprotected locations
IEC 60747-6:2016	Semiconductor devices - Part 6: Discrete devices - Thyristors
IEC 61083-1:2001	Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments
IEC 60747-2:2016	Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
EN 60721-3-3 : 95 AMD 2 97	CLASSIFICATION OF ENVIRONMENTAL CONDITIONS - CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES - STATIONARY USE AT WEATHER-PROTECTED LOCATIONS

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CEI EN 61643-341 : 2002

Superseded

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory

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