LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 1: GENERIC SPECIFICATION

Available format(s)

Hardcopy , PDF

Language(s)

English - Italian

Published date

01-01-2004

Publisher

Comitato Elettrotecnico Italiano

1 Scope
2 Normative references
3 Terminology
4 Technical aspects
5 Quality assessment procedures
6 Test and measurement procedures
Annex A (informative) - Cross
        references index
Annex B (informative) - Example
        of outline drawings
        of liquid crystal display
        cells
Annex C (normative) - Orientation
        of LCD modules
Annex D (normative) - Lot tolerance
        percentage defective
        (LTPD) sampling plans
Bibliography
Annex ZA (normative) - Normative
         references to international
         publications with their
         corresponding European
         publications

Describes liquid crystal and solid-state display devices. It defines general procedures for quality assessment to be used in the IECQ system and gives general rules for measuring methods of electrical and optical characteristics, rules for climatic and mechanical tests, and rules for endurance tests.

Committee	CT 309
DevelopmentNote	Classificazione CEI 47-30 (11/2004)
DocumentType	Standard
Pages	86
PublisherName	Comitato Elettrotecnico Italiano
Status	Current

Standards	Relationship
IEC 61747-1:1998+AMD1:2003 CSV	Identical
EN 61747-1:1999/A1:2003	Identical

IEC 60068-1:2013	Environmental testing - Part 1: General and guidance
IEC 60191-1:2007	Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
ISO 1101:2017	Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
EN 60068-1:2014	Environmental testing - Part 1: General and guidance
EN 60749 : 99 AMD 2 2001	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
IEC 60747-10:1991	Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
IEC 60191-2:2012 DB	Mechanical standardization of semiconductor devices - Part 2: Dimensions
IEC 61747-5:1998	Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods
IEC 60410:1973	Sampling plans and procedures for inspection by attributes
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV	Semiconductor devices - Mechanical and climatic test methods
EN 61747-5:1998	Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods
IEC 60191-3:1999	Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits

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CEI EN 61747-1 : 2004

Current

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory

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