INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY, 150 KHZ TO 1 GHZ - PART 3: BULK CURRENT INJECTION (BCI) METHOD

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2008

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
1 Scope and object
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test procedure
7 Test report
Annex A (informative) - Examples for test
        levels and frequency step selection
Annex B (informative) - Example of BCI test
        board and set-up
Annex C (informative) - Example of RF test
        board and set-up
Bibliography

Describes a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances.

Committee	CT 309
DevelopmentNote	Classificazione CEI 47-62. (05/2008)
DocumentType	Standard
Pages	26
PublisherName	Comitato Elettrotecnico Italiano
Status	Current

Standards	Relationship
EN 62132-3 : 2007	Identical
IEC 62132-3:2007	Identical

ISO 11452-4:2011	Road vehicles Component test methods for electrical disturbances from narrowband radiated electromagnetic energy Part 4: Harness excitation methods
EN 62132-1:2016	Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 62132-1:2015	Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

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CEI EN 62132-3 : 2008

Current

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory

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