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DD IEC PAS 62396-2 : DRAFT DEC 2007

Withdrawn
Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

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withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS
Withdrawn date

27-10-2018

Published date

23-11-2012

1 General
  1.1 Use of existing SEE data
  1.2 Deciding to perform dedicated SEE tests
2 Availability of existing SEE data for avionics
  applications
  2.1 Types of existing SEE data that may be used
      2.1.1 Sources of data, proprietary versus published
            data
      2.1.2 Data based on the use of different sources
      2.1.3 Ground level versus avionics applications
  2.2 Sources of existing data
3 Considerations for SEE Testing
  3.1 Selection of hardware to be tested
  3.2 Selection of test method
  3.3 Selection of facility providing energetic particles
      3.3.1 Spallation neutron source
      3.3.2 Monoenergetic and quasi-monoenergetic beam
            sources
      3.3.3 Thermal neutron sources
4 Converting test results to avionics SEE rates
  4.1 Use of spallation neutron source
  4.2 Use of SEU cross section curve over energy
Bibliography

Gives guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons.

Committee
GEL/107
DocumentType
Draft
PublisherName
British Standards Institution
Status
Withdrawn
SupersededBy

Standards Relationship
IEC PAS 62396-2:2007 Identical

IEC TS 62396-1:2006 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

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