DD ISO/TS 10798 : DRAFT JULY 2011
Current
The latest, up-to-date edition.
NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLEWALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS
23-11-2012
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 General principles
5 Sample preparation methods
6 Measurement procedures
7 Data analysis and results interpretation
8 Measurement uncertainty
Annex A (normative) - SEM sampling methods
Annex B (informative) - Supportive information on
EDX characterization of CNT materials
Annex C (informative) - Case study for the analysis
of as-synthesized and purified SWCNT samples
Annex D (informative) - Examples of SEM/EDX
analysis of SWCNTs
Bibliography
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