EN 171000:2001

Superseded

View Superseded by

Generic specification: Filters using waveguide type dielectric resonators

Superseded date

01-12-2004

Published date

07-08-2001

Publisher

European Committee for Standards - Electrical

1 General
  1.1 Scope
  1.2 Normative references
  1.3 Units, symbols and terminology
  1.4 Preferred ratings and characteristics
  1.5 Marking
  1.6 Order of precedence
2 Quality Assessment Procedures
  2.1 Primary stage of manufacture
  2.2 Structurally similar components
  2.3 Sub-contracting
  2.4 Incorporated components
  2.5 Manufacturers approval
  2.6 Approval procedures
  2.7 Procedures for Capability Approval
  2.8 Procedures for Qualification Approval
  2.9 Test procedures
  2.10 Screening requirements
  2.11 Rework and repair work
  2.12 Certified test records
  2.13 Validity of release
  2.14 Release for delivery
  2.15 Unchecked parameters
3 Test and measurement procedures
  3.1 General
  3.2 Test and measurement conditions
  3.3 Visual inspection
  3.4 Dimension and gauging procedure
  3.5 Electrical test procedures
  3.6 Mechanical and environmental test procedures

Applicable to filters using waveguide type dielectric resonators of assessed quality using either capability approval or qualification approval procedures.

Committee	CLC/SR 49
DevelopmentNote	Supersedes EN 61337-1-1. (10/2001)
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Superseded
SupersededBy	EN 61337-1:2004
Supersedes	EN 61337-1-1 : 1997

Standards	Relationship
DIN EN 171000:2002-02	Identical
NEN EN 171000 : 2001	Identical
SN EN 171000 : 2001	Identical
NF EN 171000 : 2005	Identical
PN EN 171000 : 2002	Identical
BS EN 171000:2001	Identical
I.S. EN 171000:2001	Identical
UNE-EN 171000:2001	Identical

CECC 00114-3 : 94 AMD 2	CAPABILITY APPROVAL OF AN ELECTRONIC COMPONENT MANUFACTURING ACTIVITY
CECC 00109 : 1974	CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS
HD 323.2.20 : 200S3	BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING
CECC 00111 PT3 : 1991 AMD 4	CENELEC ELECTRONIC COMPONENTS COMMITTEE - RULE OF PROCEDURE 11 - SPECIFICATIONS - PART 3: REGULATIONS CECC SPECIFICATIONS FOR COMPONENTS GENERAL AND PROFESSIONAL (CIVIL AND MILITARY) USAGE (EXCLUDING DETAIL SPECIFICATIONS)
HD 323.2.13 : 200S1	BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST M: LOW AIR PRESSURE
EN 60068-2-1:2007	Environmental testing - Part 2-1: Tests - Test A: Cold
EN 60068-2-2:2007	Environmental testing - Part 2-2: Tests - Test B: Dry heat
EN 60068-1:2014	Environmental testing - Part 1: General and guidance
HD 323.2.14 : 200S2	BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE
EN 60068-2-7:1993	Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state
IEC 60027-1:1992	Letters symbols to be used in electrical technology - Part 1: General
HD 323.2.30 : 200S3	BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE)
EN 60068-2-27:2009	Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
HD 323.2.3 : 200S2	BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
EN 100114-1 : 1996	RULE OF PROCEDURE - QUALITY ASSESSMENT PROCEDURES - PART 1: CECC REQUIREMENTS FOR THE APPROVAL OF AN ORGANIZATION
CECC 00114-2 : 1994	RULE OF PROCEDURE 14 - QUALITY ASSESSMENT PROCEDURES - PART 2: QUALIFICATION APPROVAL OF ELECTRONIC COMPONENTS
EN 60068-2-21:2006	Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
EN 60068-2-29:1993	Environmental testing - Part 2: Tests - Test Eb and guidance: Bump
EN 60068-2-6:2008	Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
HD 323.2.58 : 200S1	TEST TD: SOLDERABILITY, RESISTANCE TO DISSOLUTION OF METALIZATION AND TO SOLDERING HEAT OF SURFACE MOUNTING DEVICES (SMD)