FOREWORD
1 General
  1.1 Scope
  1.2 Normative references
2 Technical data
  2.1 Units and symbols
  2.2 Terms and definitions
  2.3 Preferred values
  2.4 Marking
3 Assessment procedures
4 Test and measurement procedures
  4.1 General
  4.2 Standard atmospheric conditions
  4.3 Drying
  4.4 Visual examination and check of dimensions
  4.5 Continuity (except for continuously rotating
       potentiometers)
  4.6 Element resistance
  4.7 Terminal resistance
  4.8 Maximum attenuation
  4.9 Resistance law (conformity)
  4.10 Matching of the resistance law (for ganged
       potentiometers only)
  4.11 Switch contact resistance (when appropriate)
  4.12 Voltage proof (insulated styles only)
  4.13 Insulation resistance (insulated styles only)
  4.14 Variation of resistance with temperature
  4.15 Rotational noise
  4.16 Contact resistance at low-voltage levels
  4.17 Setting ability (adjustability) and setting
       stability
  4.18 Starting torque
  4.19 Switch torque
  4.20 End stop torque
  4.21 Locking torque
  4.22 Thrust and pull on shaft
  4.23 Shaft run-out
  4.24 Lateral run-out
  4.25 Pilot (or spigot) diameter run-out
  4.26 Shaft end play
  4.27 Backlash
  4.28 Dither
  4.29 Output smoothness
  4.30 Robustness of terminals
  4.31 Sealing
  4.32 Solderability
  4.33 Resistance to soldering heat
  4.34 Change of temperature
  4.35 Vibration
  4.36 Bump
  4.37 Shock
  4.38 Climatic sequence
  4.39 Damp heat, steady state
  4.40 Mechanical endurance (potentiometers)
  4.41 AC endurance testing of mains switches on capacitive
       loads
  4.42 DC endurance testing of switches
  4.43 Electrical endurance
  4.44 Component solvent resistance
  4.45 Solvent resistance of the marking
  4.46 Microlinearity
  4.47 Mounting (for surface mount potentiometers)
  4.48 Shear (adhesion) test
  4.49 Substrate bending test (formerly bond strength of the
       end face plating)
  4.50 Solderability (for surface mount potentiometers)
  4.51 Resistance to soldering heat (for surface mount
       potentiometers)
Annex A (normative) - Rules for the preparation of detail
                      specifications for capacitors and
                      resistors for electronic equipment
Annex B (normative) - Interpretation of sampling plans and
                      procedures as described in IEC 60410
                      for use within the IEC Quality
                      Assessment System for Electronic
                      Components
Annex C (normative) - Measuring methods for rotational noise
Annex D (normative) - Apparatus for measuring mechanical
                      accuracy
Annex E (normative) - Measuring method for microlinearity
Annex F (normative) - Preferred dimensions of shaft ends,
                      bushes and for the mounting hole,
                      bush-mounted, shaft-operated electronic
                      components
Annex G (informative) - Example of common potentiometer's law
Annex H (normative) - Quality assessment procedures
Annex ZA (normative) - Normative references to international
                       publications with their corresponding
                       European publications