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EN 60512-6-2:2002

Current
Current

The latest, up-to-date edition.

Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump
Published date

17-04-2002

Foreword
1 General
2 Preparation of the specimen
3 Test method
4 Measurements
5 Details to be specified
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications

Defines a standard test method to assess the ability of components (essentially connectors) to withstand specified severities of bump.

Committee
CLC/SR 48B
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current

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IEC 60512-7:1993 Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests
IEC 60512-2-5:2003 Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance
IEC 60512-1-1:2002 Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination
IEC 60512-2-1:2002 Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method
EN 60068-2-29:1993 Environmental testing - Part 2: Tests - Test Eb and guidance: Bump
IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
EN 60512-1-1:2002 Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination
EN 60512-2-1:2002 Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method

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