INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD

Published date

14-05-2008

Publisher

European Committee for Standards - Electrical

FOREWORD
1 Scope
2 Normative references
3 Definitions
4 General
  4.1 Measurement philosophy
  4.2 Measurement principle
5 Test conditions
  5.1 General
  5.2 Frequency range
6 Test equipment
  6.1 General
  6.2 Magnetic probe
  6.3 Probe spacing fixture and placement
7 Test set-up
  7.1 General
  7.2 Probe calibration
  7.3 Modifications to standardized IC test board
      7.3.1 Layer arrangement
      7.3.2 Layer thickness
      7.3.3 Decoupling capacitors
      7.3.4 I/O pin loading
8 Test procedure
  8.1 General
  8.2 Test technique
9 Test report
  9.1 General
  9.2 Documentation
Annex A (normative) Probe calibration procedure -
        Microstrip line method
Annex B (informative) Measurement principle and
        calibration factor
Annex C (informative) Spatial resolution of magnetic
        probe
Annex D (informative) Angle pattern of probe placement
Annex E (informative) Advanced magnetic probe
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications
Bibliography

Gives a method for evaluating RF currents on the pins of an integrated circuit (IC) by means on non-contact current measurement using a miniature magnetic probe.

Committee	SR 47A
DevelopmentNote	To be read in conjunction with EN 61967-1 (05/2003)
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Current
Supersedes	EN 61967-6:2002

Standards	Relationship
BS EN 61967-6 : 2002	Identical
NF EN 61967-6 : 2003 AMD 1 2008	Identical
IEC 61967-6:2002+AMD1:2008 CSV	Identical
I.S. EN 61967-6:2003	Identical
UNE-EN 61967-6:2002/A1:2008	Identical
NBN EN 61967-6 : 2002 AMD 1 2008	Identical
DIN EN 61967-6:2008-10	Identical
PN EN 61967-6 : 2003 AMD 1 2008	Identical
CEI EN 61967-6 : 2009	Identical
NEN EN IEC 61967-6 : 2002 C1 2010	Identical

EN IEC 62969-1:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors

IEC 61967-1:2002	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
EN 61967-1:2002	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
EN 61967-4 : 2002 COR 2017	INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD (IEC 61967-4:2002/COR1:2017)
IEC 61967-4:2002+AMD1:2006 CSV	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method

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EN 61967-6:2002/A1:2008

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