ENVIRONMENTAL TESTS AND ASSOCIATED FAILURE MECHANISMS

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-1999

Publisher

Government Electronics & Information Technology Association

1 Scope
2 Reference Documents
3 Environmental Tests and Associated Failure
Mechanisms

Gives reference information concerning the environmental stresses associated with tests specifically designed to apply to (or have unique implications for) plastic encapsulated microcircuits and semiconductors, and the specific failures induced by these environmental stresses.

Committee	SSTCG12
DevelopmentNote	Annex to GEIA SSB 1. (12/2005)
DocumentType	Standard
Pages	16
PublisherName	Government Electronics & Information Technology Association
Status	Current

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GEIA SSB 1.002 : 1999

ENVIRONMENTAL TESTS AND ASSOCIATED FAILURE MECHANISMS

Table of Contents

Abstract

General Product Information

Standards Referenced By This Book

Standards Referencing This Book

Category

Subcategory