MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES

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Hardcopy , PDF

Language(s)

English

Published date

01-01-2009

Publisher

National Standards Authority of Ireland

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FOREWORD
1 Scope
2 Normative references
3 Overview
4 Measurement methods
5 Measurement conditions
6 Test and environmental examination
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding
European publications

Applicable to measurements and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values for frequency control and selection.

DevelopmentNote	For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType	Standard
Pages	23
PublisherName	National Standards Authority of Ireland
Status	Current

Standards	Relationship
EN 60689:2009	Identical
IEC 60689:2008	Identical

IEC 60068-1:2013	Environmental testing - Part 1: General and guidance
IEC 60068-2-27:2008	Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008	Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 60122-3:2010	Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
IECQ 001002-3:2005	IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES
IEC 60068-2-21:2006	Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60068-2-13:1983	Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
IEC 61178-3:1993	Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
IECQ 001002-2:1998	IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION
IEC 60068-2-31:2008	Environmental testing - Part 2-31: Tests - Test Ec: Rough handling shocks, primarily for equipment-type specimens
IEC Q 01 : 5.0	IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ SYSTEM) - BASIC RULES
Q C 001005 : 1995	REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER THE IECQ SYSTEM, INCLUDING ISO 900
IEC 60068-2-17:1994	Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-2:2007	Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 60050-561:2014	International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
IEC 60122-1:2002	Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 61178-2:1993	Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
IEC 60068-2-1:2007	Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009	Environmental testing - Part 2-14: Tests - Test N: Change of temperature
EN 60122-3:2010	Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
IEC 60068-2-30:2005	Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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I.S. EN 60689:2009

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Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

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