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IEC 60148:1969

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Letter symbols for semiconductor devices and integrated microcircuits

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

01-04-1995

Language(s)

English - French

Published date

01-01-1969

148A FIRST SUPPLEMENT 1974 148B SECOND SUPPLEMENT 1979 Provides a uniform system of letter symbols to be used in the semiconductor device and integrated microcircuit fields.

Committee
TC 47
DocumentType
Standard
Pages
67
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
DIN 41785-3:1975-02 Similar to
NBN C 83 300 : 1985 Identical
NBN C 86 010 : 1984 Identical
NEN 10148 : 1980 Identical
UNE 21321:1978 Identical
NFC 96 112 : 81 AMD 1 81 Similar to
NFC 96 113 : 1980 Similar to
BS 3363:1980 Identical

BS EN 153000:1998 Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)
BS EN 190100:1993 Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits
EN 153000:1998 Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval)
DIN EN 190000:1996-05 GENERIC SPECIFICATION - MONOLITHIC INTEGRATED CIRCUITS
I.S. EN 153000:1998 DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL) (GENERIC SPECIFICATION)
BS CECC 63000:1990 Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits
BS CECC 50000:1987 Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
BS CECC 90300:1988 Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits
BS EN 120000:1996 Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices
CEI EN 61360-1 : 2013 STANDARD DATA ELEMENT TYPES WITH ASSOCIATED CLASSIFICATION SCHEME FOR ELECTRIC ITEMS - PART 1: DEFINITIONS - PRINCIPLES AND METHODS
BS 9450:1975 Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test
DEFSTAN 59-62(PT5)/1(1983) : 1983 MICROCIRCUITS ELECTRONIC (INTEGRATED CIRCUITS) - PART 5: ANALOGUE SWITCH/MULTIPLEXERS
DEFSTAN 59-62(PT7)/1(1983) : 1983 MICROCIRCUITS ELECTRONIC (INTEGRATED CIRCUITS) - PART 7: MEMORIES/MICROPROCESSORS
BS CECC90100(1987) : AMD 7845 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: SECTIONAL SPECIFICATION: DIGITAL MONOLITHIC INTEGRATED CIRCUITS

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