IEC 60333:1993
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
31-12-2021
English - French
14-07-1993
FOREWORD
Clause
1 Scope and object
2 Normative references
3 General requirements
4 Resolution measurements
4.1 Energy resolution
4.2 Time resolution
4.3 Position, resolution and linearity of a
position-sensitive detector
5 Noise measurement
5.1 Noise measurement by pulse-height distribution
(preferred method)
5.2 Noise measurement by oscilloscope and true
root-mean-square voltmeter
5.3 Measurement of electronic noise with the detector
removed
5.4 Determination of detector contribution to noise and
resolution
5.5 Noise linewidth (FWHM) as a function of amplifier
shaping time index
6 Sensitivity to ambient conditions
6.1 Atmospheric sensitivity
6.2 Vacuum thermal cycle test
6.3 Mechanical and environmental tests
6.4 Light sensitivity
6.5 Radiation damage measurements
7 Other measurements
7.1 Current-voltage characteristics
7.2 Dead layer energy loss
7.3 Sensitive area
7.4 Detector thickness (transmission detectors)
7.5 Capacitance-voltage characteristics
Annexes
A Symbols and glossary
B General information concerning semiconductor
charged-particle detectors
C Bibliography
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