IEC 60427:2000
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
Synthetic testing of high-voltage alternating current circuit-breakers
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
23-05-2006
English - French, Spanish, Castilian
07-04-2000
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Definitions
4 Synthetic testing techniques and methods -
Short-circuit breaking tests
4.1 Basic principles and general requirements for
synthetic breaking test methods
4.2 Synthetic test circuits and related specific
requirements for breaking tests
5 Short-circuit making tests
5.1 Basic principles and general requirements for
synthetic making test methods
5.2 Synthetic test circuit and related specific
requirements for making tests
6 Specific requirements for synthetic tests for making and
breaking performance related to the requirements of
subclauses 6.102 to 6.111 inclusive of IEC 60056
Annexes
AA (informative) Current distortion
BB (informative) Current injection methods
CC (informative) Voltage injection methods
DD (informative) Duplicate circuit (transfomer or
Skeats circuit)
EE (normative) Information to be given and results to
be recorded for synthetic tests
FF (informative) Special procedures for testing
circuit-breakers having parallel
breaking resistors
GG (normative) Synthetic methods for capacitive-
current switching
HH (informative) Reignition methods to prolong arcing
Figures
1 - Interrupting process: basic time intervals
2 - Example of recovery voltage
3 - Equivalent surge impedance within the voltage
circuit of current injection scheme
4 - Making process: basic time intervals
5 - Maximum allowable pre-arcing time for valid
making test at reduced voltage
6 - Synthetic make circuit and waveforms
AA.1a - Direct circuit, simplified diagram
AA.1b - Prospective short-circuit current
AA.1c - Distortion current
AA.1d - Distortion current
AA.2a - Simplified circuit diagram
AA.2b - Current and arc-voltage characteristics for
symmetrical current
AA.2c - Current and arc-voltage characteristics for
asymmetrical current
AA.3a to AA.3d - Reduction of amplitude and duration
of final current loop of arcing
BB.1 - Typical current injection circuit with voltage
circuit in parallel with the test circuit breaker
BB.2 - Injection timing for current injection scheme
with circuit BB.1
BB.3 - Typical current injection circuit with voltage
circuit in parallel with the auxiliary
circuit-breaker
BB.4 - Injection timing for current injection scheme
with circuit BB.3
BB.5 - Examples of the determination of the interval of
significant change of arc-voltage from the
oscillograms
CC.1 - Typical voltage injection circuit diagram with
voltage circuit in parallel with the auxiliary
circuit-breaker (simplified diagram)
CC.2 - TRV waveshapes in a voltage injection circuit
with the voltage circuit in parallel with the
auxiliary circuit-breaker
DD.1 - Transformer or Skeats circuit
DD.2 - Triggered transformer or Skeats circuit
GG.1 - Synthetic testing scheme (parallel mode)
GG.2 - Synthetic testing scheme with an inductive current
circuit and with facility to adjust a voltage jump
GG.3 - Synthetic voltage injection circuit providing a
voltage jump
GG.4 - Synthetic current injection scheme
GG.5 - Synthetic test circuit (serial mode) to apply to
both sides of the test breaker the normal system
recovery voltage
GG.6 - Synthetic testing scheme for making
HH.1 - Typical reignition circuit diagram for prolonging
arc-duration
HH.2 - Combined Skeats and current injection circuits
HH.3 - Typical waveforms obtained on an asymmetrical test
using the circuit in figure HH.2
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