Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

11-06-2008

Publisher

International Electrotechnical Committee

FOREWORD
1 Scope and object
2 Normative references
3 Preparations
4 Test method
5 Details to be specified

IEC 60512-16-1:2008 details a standard test method to assess the effectiveness of the elastic system of contacts to resist damage from the insertion of a specified test probe.

Committee	TC 48/SC 48B
DevelopmentNote	To be read in conjunction with IEC 60512-1 and IEC 60512-1-100. (06/2008) Supersedes IEC 60512-8. (05/2012) Stability Date: 2017. (10/2012)
DocumentType	Standard
Pages	12
PublisherName	International Electrotechnical Committee
Status	Current
Supersedes	IEC 60512-8:1993

Standards	Relationship
DIN EN 60512-16-1:2009-03	Identical
NF EN 60512-16-1 : 2008	Identical
NEN EN IEC 60512-16-1 : 2008	Identical
I.S. EN 60512-16-1:2008	Identical
PN EN 60512-16-1 : 2010	Identical
UNE-EN 60512-16-1:2008	Identical
BS EN 60512-16-1:2008	Identical
CEI EN 60512-16-1 : 2009	Identical
EN 60512-16-1 : 2008	Identical
JIS C 5402-16-1:2014	Identical

IEC 60512-16-5:2008	Connectors for electronic equipment - Tests and measurements - Part 16-5: Mechanical tests on contacts and terminations - Test 16e: Gauge retention force (resilient contacts)
IEC 60512-1-1:2002	Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination

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IEC 60512-16-1:2008

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Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

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