Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

09-11-2000

Publisher

International Electrotechnical Committee

FOREWORD
INTRODUCTION
1 General
      1.1 Scope
      1.2 Normative references
      1.3 Definitions
      1.4 Symbols
2 Essential ratings and characteristics
      2.1 General
      2.2 Ratings (limiting values)
      2.3 Characteristics
3 Measuring methods
      3.1 General
      3.2 Output Hall voltage (VH)
      3.3 Offset voltage (Vo)
      3.4 Input resistance (Rin)
      3.5 Output resistance (Rout)
      3.6 Temperature coefficient of output Hall voltage
             (aVH)
      3.7 Temperature coefficient of input resistance
             (aRin)

Provides standards for packaged semiconductor Hall elements which utilize the Hall effect.

Committee	TC 47/SC 47E
DevelopmentNote	Stability Date: 2017. (09/2017)
DocumentType	Standard
Pages	14
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
BS IEC 60747-14.2 : 2000	Identical
NEN IEC 60747-14-2 : 2001	Identical
BS IEC 60747-14-2:2000	Identical

IEC 60747-1:2006+AMD1:2010 CSV

Semiconductor devices - Part 1: General

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IEC 60747-14-2:2000

Current

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

Category

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